In separate rooms, SAMS has a Scanning Electron Microscope and a Transmission Electron Microscope.

JEOL 6390LV Scanning Electron Microscope

This low vacuum instrument, purchased with ARC funds in 2007, provides backscattered and secondary electron imaging in both high and low vacuum modes. It can be fitted with an Emitech cool stage for imaging unfixed samples in low vacuum. Freeze-drying of samples can also be accomplished at low vacuum in the microscope using the cool stage or by pre-freezing material in liquid nitrogen. Samples can then be rapidly coated with gold palladium for high vacuum, high resolution imaging. A conventional critical point dryer with large capacity is also available. Recent usage of the microscope has included the examination of phytoplankton, including the identification of toxic species, a study of barnacles in the genus Elminius and for undergraduate teaching.

JEOL 100S Transmission Electron Microscope

This is a conventional TEM with 100kV beam, tungsten filament and photographic plate image capture. Associated preparation equipment includes a glass knife maker and ultramicrotome.

For more information, please contact Mr Robin Harvey.